Probe #a03d512a49 of HP 2000

Log: smartctl

/dev/sda smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.12.13-amd64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Silicon Motion based SSDs Device Model: ADATA SU650 Serial Number: -- LU WWN Device Id: 0 000000 ... Firmware Version: XD0R024F User Capacity: 120,034,123,776 bytes [120 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic Device is: In smartctl database 7.3/5528 ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sun Mar 30 19:50:49 2025 MST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Disabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 1) seconds. Offline data collection capabilities: (0x59) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 2) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 100 100 000 - 3287 12 Power_Cycle_Count -O--CK 100 100 000 - 2285 160 Uncorrectable_Error_Cnt -O--CK 100 100 050 - 0 161 Valid_Spare_Block_Cnt -O--CK 100 100 050 - 100 163 Initial_Bad_Block_Count -O--CK 100 100 000 - 20 164 Total_Erase_Count -O--CK 100 100 000 - 117278 165 Max_Erase_Count -O--CK 100 100 000 - 259 166 Min_Erase_Count -O--CK 100 100 000 - 180 167 Average_Erase_Count -O--CK 100 100 000 - 219 148 Total_SLC_Erase_Ct -O--CK 100 100 000 - 351834 149 Max_SLC_Erase_Ct -O--CK 100 100 000 - 778 150 Min_SLC_Erase_Ct -O--CK 100 100 000 - 540 151 Average_SLC_Erase_Ct -O--CK 100 100 000 - 659 159 DRAM_1_Bit_Error_Count -O--CK 100 100 000 - 0 168 Max_Erase_Count_of_Spec -O--CK 100 100 000 - 778 169 Remaining_Lifetime_Perc -O--CK 100 100 000 - 93 177 Wear_Leveling_Count -O--CK 100 100 000 - 135 181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 000 - 0 192 Power-Off_Retract_Count -O--CK 100 100 000 - 1349 194 Temperature_Celsius -O--CK 100 100 000 - 17 195 Hardware_ECC_Recovered -O--CK 100 100 000 - 0 196 Reallocated_Event_Count -O--CK 100 100 000 - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0 232 Available_Reservd_Space -O--CK 100 100 000 - 100 241 Host_Writes_32MiB -O--CK 100 100 000 - 540899 242 Host_Reads_32MiB -O--CK 100 100 000 - 382508 245 TLC_Writes_32MiB -O--CK 100 100 000 - 843253 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 2 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 5 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 8 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (2 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Aborted by host 40% 2823 - # 2 Extended offline Completed without error 00% 2124 - # 3 Short offline Aborted by host 80% 1965 - # 4 Short offline Completed without error 00% 1810 - # 5 Short offline Completed without error 00% 1799 - # 6 Short offline Completed without error 00% 1797 - # 7 Short offline Completed without error 00% 1664 - # 8 Short offline Completed without error 00% 1540 - # 9 Short offline Completed without error 00% 1534 - #10 Short offline Completed without error 00% 1466 - #11 Short offline Completed without error 00% 1447 - #12 Short offline Completed without error 00% 1434 - #13 Short offline Completed without error 00% 1412 - #14 Short offline Completed without error 00% 1388 - #15 Short offline Completed without error 00% 1370 - #16 Extended offline Completed without error 00% 1143 - #17 Extended offline Completed without error 00% 708 - #18 Short offline Completed without error 00% 708 - #19 Short offline Aborted by host 90% 624 - SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 2285 --- Lifetime Power-On Resets 0x01 0x010 4 3287 --- Power-on Hours 0x01 0x018 6 35448395670 --- Logical Sectors Written 0x01 0x020 6 377346984 --- Number of Write Commands 0x01 0x028 6 25068096248 --- Logical Sectors Read 0x01 0x030 6 587891434 --- Number of Read Commands 0x01 0x038 6 11834044091 --- Date and Time TimeStamp 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 8 --- Resets Between Cmd Acceptance and Completion 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 10663 --- Number of Hardware Resets 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 17 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x000a 4 7 Device-to-host register FISes sent due to a COMRESET


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