/dev/sda === START OF INFORMATION SECTION === Model Family: Seagate Barracuda 7200.7 and 7200.7 Plus Device Model: ST3120026AS Serial Number: -- Firmware Version: 3.05 User Capacity: 120 034 123 776 bytes [120 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-6 T13/1410D revision 2 Local Time is: Sun Jan 22 19:40:08 2017 YEKT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 430) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 85) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 059 054 006 - 176837469 3 Spin_Up_Time PO---- 097 096 000 - 0 4 Start_Stop_Count -O--CK 098 098 020 - 3027 5 Reallocated_Sector_Ct PO--CK 100 100 036 - 1 7 Seek_Error_Rate POSR-- 088 060 030 - 703643247 9 Power_On_Hours -O--CK 078 078 000 - 19489 10 Spin_Retry_Count PO--C- 100 100 097 - 0 12 Power_Cycle_Count -O--CK 094 094 020 - 6240 194 Temperature_Celsius -O---K 042 055 000 - 42 195 Hardware_ECC_Recovered -O-RC- 059 053 000 - 176837469 197 Current_Pending_Sector -O--C- 100 100 000 - 0 198 Offline_Uncorrectable ----C- 100 100 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 200 001 000 - 8803 200 Multi_Zone_Error_Rate ------ 100 253 000 - 0 202 Data_Address_Mark_Errs -O--CK 100 253 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory not supported SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 5 Comprehensive SMART error log 0x03 SL R/O 5 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 SL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x20 SL R/O 1 Streaming performance log [OBS-8] 0x21 SL R/O 1 Write stream error log 0x22 SL R/O 1 Read stream error log 0x23 SL R/O 1 Delayed sector log [OBS-8] 0x80-0x9f SL R/W 16 Host vendor specific log 0xa0 SL VS 1 Device vendor specific log 0xa1 SL VS 20 Device vendor specific log 0xa2 SL VS 101 Device vendor specific log 0xa8 SL VS 20 Device vendor specific log 0xa9 SL VS 1 Device vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 257 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 257 occurred at disk power-on lifetime: 5327 hours (221 days + 23 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 21 60 a5 b2 41 Error: UNC 33 sectors at LBA = 0x01b2a560 = 28484960 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 40 3f a5 b2 41 00 00:02:38.406 READ DMA c8 00 40 ff 32 bf 40 00 00:02:38.405 READ DMA ca 00 40 ff 32 bf 40 00 00:02:38.404 WRITE DMA c8 00 40 ff a4 b2 41 00 00:02:38.404 READ DMA c8 00 40 bf 32 bf 40 00 00:02:38.403 READ DMA Error 256 occurred at disk power-on lifetime: 4885 hours (203 days + 13 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 c8 ed 5f 42 Error: ICRC, ABRT at LBA = 0x025fedc8 = 39841224 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 40 89 ed 5f 42 00 00:03:57.771 READ DMA c8 00 30 b1 eb 5f 42 00 00:03:56.753 READ DMA ca 00 80 3b 4a 63 4d 00 00:03:55.736 WRITE DMA ca 00 18 ff ba d1 44 00 00:03:53.702 WRITE DMA ca 00 80 3f 4e ca 44 00 00:03:52.684 WRITE DMA Error 255 occurred at disk power-on lifetime: 4492 hours (187 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 7e 9f 04 40 Error: ICRC, ABRT at LBA = 0x00049f7e = 302974 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 40 3f 9f 04 40 00 00:01:13.259 READ DMA c8 00 40 ff 9e 04 40 00 00:01:13.257 READ DMA c8 00 40 bf f4 01 40 00 00:01:13.248 READ DMA ca 00 40 bf f4 01 40 00 00:01:13.246 WRITE DMA c8 00 40 ff 9e 04 40 00 00:01:13.239 READ DMA Error 254 occurred at disk power-on lifetime: 4427 hours (184 days + 11 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 86 e8 5e 42 Error: ICRC, ABRT at LBA = 0x025ee886 = 39774342 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 80 07 e8 5e 42 00 00:00:39.881 READ DMA c8 00 80 87 e7 5e 42 00 00:00:39.879 READ DMA c8 00 80 07 e7 5e 42 00 00:00:39.878 READ DMA c8 00 80 87 e6 5e 42 00 00:00:39.877 READ DMA c8 00 80 07 e6 5e 42 00 00:00:39.876 READ DMA Error 253 occurred at disk power-on lifetime: 3494 hours (145 days + 14 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 fe 69 4f 43 Error: ICRC, ABRT at LBA = 0x034f69fe = 55536126 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 80 7f 69 4f 43 00 02:54:02.103 READ DMA c8 00 80 ff 68 4f 43 00 02:54:02.096 READ DMA c8 00 80 7f 68 4f 43 00 02:54:02.085 READ DMA c8 00 80 ff 67 4f 43 00 02:54:02.078 READ DMA c8 00 80 7f 67 4f 43 00 02:54:02.067 READ DMA SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) not supported