/dev/sda === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: SAMSUNG MZ7TD256HAFV-000L9 Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: DXT02L5Q User Capacity: 256,060,514,304 bytes [256 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Sun Jul 17 16:35:25 2022 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x80) Offline data collection activity was never started. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (11520) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 40) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 9 Power_On_Hours -O--CK 096 096 000 - 19922 12 Power_Cycle_Count -O--CK 097 097 000 - 2309 175 Program_Fail_Count_Chip -O--CK 099 099 010 - 2 176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0 177 Wear_Leveling_Count PO--C- 089 089 005 - 127 178 Used_Rsvd_Blk_Cnt_Chip PO--C- 099 099 010 - 2 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 099 099 010 - 2 180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 099 099 010 - 6238 181 Program_Fail_Cnt_Total -O--CK 099 099 010 - 2 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 099 099 010 - 2 184 End-to-End_Error PO--CK 100 100 097 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 071 037 000 - 29 195 ECC_Error_Rate -O-RC- 200 200 000 - 0 198 Offline_Uncorrectable ----CK 100 100 000 - 0 199 CRC_Error_Count -OSRCK 253 253 000 - 916 233 Media_Wearout_Indicator -O-RCK 199 199 000 - 3242073 234 Unknown_Samsung_Attr -O--C- 099 099 000 - 812 235 POR_Recovery_Count -O--C- 099 099 000 - 398 236 Unknown_Samsung_Attr -O--C- 099 099 000 - 76 237 Unknown_Samsung_Attr -O--C- 099 099 000 - 127 238 Unknown_Samsung_Attr -O--C- 099 099 000 - 2 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x02 GPL,SL R/O 1 Comprehensive SMART error log 0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log 0x06 GPL,SL R/O 1 SMART self-test log 0x07 GPL,SL R/O 1 Extended self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 NCQ Command Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 1 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa0 GPL,SL VS 16 Device vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 255 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) Device State: SCT command executing in background (5) Current Temperature: 30 Celsius Power Cycle Min/Max Temperature: 27/40 Celsius Lifetime Min/Max Temperature: 0/70 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 3 (Unknown, should be 2) Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (20) Index Estimated Time Temperature Celsius 21 2022-07-17 14:28 28 ********* ... ..( 8 skipped). .. ********* 30 2022-07-17 14:37 28 ********* 31 2022-07-17 14:38 29 ********** ... ..( 2 skipped). .. ********** 34 2022-07-17 14:41 29 ********** 35 2022-07-17 14:42 28 ********* 36 2022-07-17 14:43 28 ********* 37 2022-07-17 14:44 29 ********** 38 2022-07-17 14:45 30 *********** 39 2022-07-17 14:46 29 ********** ... ..( 17 skipped). .. ********** 57 2022-07-17 15:04 29 ********** 58 2022-07-17 15:05 28 ********* 59 2022-07-17 15:06 29 ********** ... ..( 5 skipped). .. ********** 65 2022-07-17 15:12 29 ********** 66 2022-07-17 15:13 28 ********* 67 2022-07-17 15:14 29 ********** 68 2022-07-17 15:15 29 ********** 69 2022-07-17 15:16 28 ********* 70 2022-07-17 15:17 28 ********* 71 2022-07-17 15:18 29 ********** 72 2022-07-17 15:19 30 *********** 73 2022-07-17 15:20 31 ************ 74 2022-07-17 15:21 32 ************* ... ..( 12 skipped). .. ************* 87 2022-07-17 15:34 32 ************* 88 2022-07-17 15:35 38 ******************* 89 2022-07-17 15:36 31 ************ 90 2022-07-17 15:37 29 ********** 91 2022-07-17 15:38 28 ********* ... ..( 14 skipped). .. ********* 106 2022-07-17 15:53 28 ********* 107 2022-07-17 15:54 29 ********** 108 2022-07-17 15:55 30 *********** 109 2022-07-17 15:56 29 ********** 110 2022-07-17 15:57 28 ********* 111 2022-07-17 15:58 30 *********** 112 2022-07-17 15:59 28 ********* 113 2022-07-17 16:00 28 ********* 114 2022-07-17 16:01 28 ********* 115 2022-07-17 16:02 27 ******** ... ..( 17 skipped). .. ******** 5 2022-07-17 16:20 27 ******** 6 2022-07-17 16:21 28 ********* ... ..( 3 skipped). .. ********* 10 2022-07-17 16:25 28 ********* 11 2022-07-17 16:26 29 ********** 12 2022-07-17 16:27 28 ********* ... ..( 6 skipped). .. ********* 19 2022-07-17 16:34 28 ********* 20 2022-07-17 16:35 30 *********** SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 65535+ Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 60 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC /dev/sdb === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 840 EVO 250GB Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: EXT0BB6Q User Capacity: 250,059,350,016 bytes [250 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Sun Jul 17 16:35:25 2022 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Unexpected SCT status 0x0001 (action_code=4, function_code=2) Wt Cache Reorder: Unknown (SCT Feature Control command failed) === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 4800) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 80) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 096 096 000 - 20189 12 Power_Cycle_Count -O--CK 097 097 000 - 2743 177 Wear_Leveling_Count PO--C- 093 093 000 - 73 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 069 042 000 - 31 195 ECC_Error_Rate -O-RC- 200 200 000 - 0 199 CRC_Error_Count -OSRCK 061 061 000 - 39143 235 POR_Recovery_Count -O--C- 099 099 000 - 1726 241 Total_LBAs_Written -O--CK 099 099 000 - 22219775605 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 GPL,SL VS 16 Device vendor specific log 0xce GPL,SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 0 - # 2 Short offline Completed without error 00% 0 - # 3 Short offline Completed without error 00% 0 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 1 (0x0001) Device State: Active (0) Current Temperature: 31 Celsius Power Cycle Min/Max Temperature: ?/ ? Celsius Lifetime Min/Max Temperature: ?/ ? Celsius Under/Over Temperature Limit Count: 0/121172 SCT Temperature History Version: 2 Temperature Sampling Period: 10 minutes Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: ?/ ? Celsius Min/Max Temperature Limit: ?/ ? Celsius Temperature History Size (Index): 128 (20) Index Estimated Time Temperature Celsius 21 2022-07-16 19:20 31 ************ ... ..( 8 skipped). .. ************ 30 2022-07-16 20:50 31 ************ 31 2022-07-16 21:00 32 ************* 32 2022-07-16 21:10 31 ************ ... ..( 4 skipped). .. ************ 37 2022-07-16 22:00 31 ************ 38 2022-07-16 22:10 32 ************* 39 2022-07-16 22:20 31 ************ ... ..( 30 skipped). .. ************ 70 2022-07-17 03:30 31 ************ 71 2022-07-17 03:40 32 ************* 72 2022-07-17 03:50 34 *************** 73 2022-07-17 04:00 34 *************** 74 2022-07-17 04:10 35 **************** ... ..( 13 skipped). .. **************** 88 2022-07-17 06:30 35 **************** 89 2022-07-17 06:40 33 ************** 90 2022-07-17 06:50 31 ************ ... ..( 2 skipped). .. ************ 93 2022-07-17 07:20 31 ************ 94 2022-07-17 07:30 30 *********** 95 2022-07-17 07:40 30 *********** 96 2022-07-17 07:50 30 *********** 97 2022-07-17 08:00 31 ************ ... ..( 2 skipped). .. ************ 100 2022-07-17 08:30 31 ************ 101 2022-07-17 08:40 30 *********** ... ..( 4 skipped). .. *********** 106 2022-07-17 09:30 30 *********** 107 2022-07-17 09:40 32 ************* 108 2022-07-17 09:50 31 ************ 109 2022-07-17 10:00 30 *********** 110 2022-07-17 10:10 30 *********** 111 2022-07-17 10:20 31 ************ 112 2022-07-17 10:30 30 *********** ... ..( 25 skipped). .. *********** 10 2022-07-17 14:50 30 *********** 11 2022-07-17 15:00 31 ************ 12 2022-07-17 15:10 30 *********** ... ..( 4 skipped). .. *********** 17 2022-07-17 16:00 30 *********** 18 2022-07-17 16:10 31 ************ 19 2022-07-17 16:20 31 ************ 20 2022-07-17 16:30 31 ************ SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 74 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 74 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC /dev/sdc === START OF INFORMATION SECTION === Model Family: HGST Travelstar 5K1000 Device Model: HGST HTS541010A9E680 Serial Number: -- LU WWN Device Id: 5 000cca ... Firmware Version: JA0OA7J0 User Capacity: 1,000,204,886,016 bytes [1.00 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 5400 rpm Form Factor: 2.5 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 2.6, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Sun Jul 17 16:35:25 2022 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x80) Offline data collection activity was never started. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 45) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 243) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate PO-R-- 100 100 062 - 0 2 Throughput_Performance P-S--- 100 100 040 - 0 3 Spin_Up_Time POS--- 168 168 033 - 1 4 Start_Stop_Count -O--C- 097 097 000 - 5508 5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0 7 Seek_Error_Rate PO-R-- 100 100 067 - 0 8 Seek_Time_Performance P-S--- 100 100 040 - 0 9 Power_On_Hours -O--C- 086 086 000 - 6281 10 Spin_Retry_Count PO--C- 100 100 060 - 0 12 Power_Cycle_Count -O--CK 100 100 000 - 1230 191 G-Sense_Error_Rate -O-R-- 100 100 000 - 0 192 Power-Off_Retract_Count -O--CK 098 098 000 - 466 193 Load_Cycle_Count -O--C- 092 092 000 - 84824 194 Temperature_Celsius -O---- 187 187 000 - 32 (Min/Max 1/43) 196 Reallocated_Event_Count -O--CK 100 100 000 - 22 197 Current_Pending_Sector -O---K 100 100 000 - 0 198 Offline_Uncorrectable ---R-- 100 100 000 - 0 199 UDMA_CRC_Error_Count -O-R-- 200 200 000 - 1 223 Load_Retry_Count -O-R-- 100 100 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) Device Error Count: 102 (device log contains only the most recent 4 errors) CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 102 [1] occurred at disk power-on lifetime: 3490 hours (145 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 10 -- 51 00 a8 00 00 00 60 09 58 00 00 Error: IDNF 168 sectors at LBA = 0x00600958 = 6293848 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 00 a8 00 00 00 60 09 58 e0 00 00:18:32.827 READ DMA EXT 35 00 00 00 08 00 00 00 5b 93 88 e0 00 00:18:32.827 WRITE DMA EXT 25 00 00 01 00 00 00 00 60 08 58 e0 00 00:18:16.277 READ DMA EXT ec 00 00 00 00 00 00 00 00 00 00 a0 00 00:18:16.211 IDENTIFY DEVICE ec 00 00 00 00 00 00 00 00 00 00 a0 00 00:18:15.583 IDENTIFY DEVICE Error 101 [0] occurred at disk power-on lifetime: 3490 hours (145 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 10 -- 51 01 00 00 00 00 60 08 58 00 00 Error: IDNF 256 sectors at LBA = 0x00600858 = 6293592 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 01 00 00 00 00 60 08 58 e0 00 00:18:16.277 READ DMA EXT ec 00 00 00 00 00 00 00 00 00 00 a0 00 00:18:16.211 IDENTIFY DEVICE ec 00 00 00 00 00 00 00 00 00 00 a0 00 00:18:15.583 IDENTIFY DEVICE 25 00 00 00 08 00 00 00 01 0d 68 e0 00 00:18:08.781 READ DMA EXT 25 00 00 00 10 00 00 3a 38 30 00 e0 00 00:16:48.494 READ DMA EXT Error 100 [3] occurred at disk power-on lifetime: 3490 hours (145 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 10 -- 51 00 10 00 00 00 00 00 00 00 00 Error: IDNF 16 sectors at LBA = 0x00000000 = 0 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 00 10 00 00 00 00 00 00 e0 00 00:04:25.860 READ DMA EXT 25 00 00 00 10 00 00 3a 38 30 00 e0 00 00:04:25.397 READ DMA EXT ea 00 00 00 00 93 bb 87 00 00 00 a0 00 00:03:55.058 FLUSH CACHE EXT 35 00 00 00 08 00 00 3a 93 bb 80 e0 00 00:03:50.044 WRITE DMA EXT ea 00 00 00 00 93 bc 0f 00 00 00 a0 00 00:03:50.036 FLUSH CACHE EXT Error 99 [2] occurred at disk power-on lifetime: 3174 hours (132 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 84 -- 51 00 a0 00 00 40 f9 7d 90 00 00 Error: ICRC, ABRT 160 sectors at LBA = 0x40f97d90 = 1090092432 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 35 00 00 01 00 00 00 40 f9 7d 30 e0 00 00:09:40.567 WRITE DMA EXT 35 00 00 01 00 00 00 40 f9 7c 30 e0 00 00:09:40.567 WRITE DMA EXT 35 00 00 01 00 00 00 41 07 0c 18 e0 00 00:09:40.567 WRITE DMA EXT 35 00 00 01 00 00 00 41 07 0b 18 e0 00 00:09:40.566 WRITE DMA EXT 35 00 00 01 00 00 00 41 07 0a 18 e0 00 00:09:40.566 WRITE DMA EXT SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 32 Celsius Power Cycle Min/Max Temperature: 25/35 Celsius Lifetime Min/Max Temperature: 1/43 Celsius Specified Max Operating Temperature: 28 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/60 Celsius Min/Max Temperature Limit: -40/65 Celsius Temperature History Size (Index): 128 (96) Index Estimated Time Temperature Celsius 97 2022-07-17 14:28 30 *********** ... ..( 7 skipped). .. *********** 105 2022-07-17 14:36 30 *********** 106 2022-07-17 14:37 29 ********** 107 2022-07-17 14:38 29 ********** 108 2022-07-17 14:39 30 *********** ... ..( 15 skipped). .. *********** 124 2022-07-17 14:55 30 *********** 125 2022-07-17 14:56 31 ************ ... ..( 4 skipped). .. ************ 2 2022-07-17 15:01 31 ************ 3 2022-07-17 15:02 30 *********** ... ..( 28 skipped). .. *********** 32 2022-07-17 15:31 30 *********** 33 2022-07-17 15:32 31 ************ 34 2022-07-17 15:33 30 *********** ... ..( 8 skipped). .. *********** 43 2022-07-17 15:42 30 *********** 44 2022-07-17 15:43 31 ************ ... ..( 17 skipped). .. ************ 62 2022-07-17 16:01 31 ************ 63 2022-07-17 16:02 32 ************* 64 2022-07-17 16:03 31 ************ 65 2022-07-17 16:04 32 ************* ... ..( 19 skipped). .. ************* 85 2022-07-17 16:24 32 ************* 86 2022-07-17 16:25 31 ************ 87 2022-07-17 16:26 31 ************ 88 2022-07-17 16:27 31 ************ 89 2022-07-17 16:28 32 ************* 90 2022-07-17 16:29 31 ************ 91 2022-07-17 16:30 32 ************* ... ..( 4 skipped). .. ************* 96 2022-07-17 16:35 32 ************* SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0009 2 65535+ Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 68 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS