/dev/sda === START OF INFORMATION SECTION === Model Family: Western Digital Green Device Model: WDC WD10EZRX-00A8LB0 Serial Number: -- LU WWN Device Id: 5 0014ee ... Firmware Version: 01.01A01 User Capacity: 1.000.204.886.016 bytes [1,00 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS (minor revision not indicated) SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Thu May 25 08:06:34 2017 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (13080) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 144) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x30b5) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 200 200 051 - 3 3 Spin_Up_Time POS--K 140 135 021 - 3983 4 Start_Stop_Count -O--CK 095 095 000 - 5346 5 Reallocated_Sector_Ct PO--CK 200 200 140 - 0 7 Seek_Error_Rate -OSR-K 200 200 000 - 0 9 Power_On_Hours -O--CK 080 080 000 - 15321 10 Spin_Retry_Count -O--CK 100 100 000 - 0 11 Calibration_Retry_Count -O--CK 100 100 000 - 0 12 Power_Cycle_Count -O--CK 099 099 000 - 1604 192 Power-Off_Retract_Count -O--CK 200 200 000 - 202 193 Load_Cycle_Count -O--CK 170 170 000 - 91504 194 Temperature_Celsius -O---K 116 088 000 - 27 196 Reallocated_Event_Count -O--CK 200 200 000 - 0 197 Current_Pending_Sector -O--CK 200 200 000 - 0 198 Offline_Uncorrectable ----CK 200 200 000 - 0 199 UDMA_CRC_Error_Count -O--CK 200 200 000 - 0 200 Multi_Zone_Error_Rate ---R-- 200 200 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 5 Comprehensive SMART error log 0x03 GPL R/O 6 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 SATA NCQ Queued Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa0-0xa7 GPL,SL VS 16 Device vendor specific log 0xa8-0xb7 GPL,SL VS 1 Device vendor specific log 0xbd GPL,SL VS 1 Device vendor specific log 0xc0 GPL,SL VS 1 Device vendor specific log 0xc1 GPL VS 93 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (6 sectors) Device Error Count: 14150 (device log contains only the most recent 24 errors) CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 14150 [13] occurred at disk power-on lifetime: 2143 hours (89 days + 7 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 04 -- 61 00 1a 00 00 00 1a a2 ee e0 00 Device Fault; Error: ABRT 26 sectors at LBA = 0x001aa2ee = 1745646 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 00 1a 00 00 00 1a a2 ee e0 00 07:03:07.463 READ DMA EXT 25 00 00 00 80 00 00 57 07 d1 a0 e0 00 07:03:07.389 READ DMA EXT 35 00 00 00 08 00 00 00 5c 18 58 e0 00 07:03:07.388 WRITE DMA EXT 25 00 00 00 80 00 00 57 07 d1 98 e0 00 07:03:07.388 READ DMA EXT 35 00 00 00 10 00 00 00 57 08 08 e0 00 07:03:07.387 WRITE DMA EXT Error 14149 [12] occurred at disk power-on lifetime: 2143 hours (89 days + 7 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 04 -- 61 00 80 00 00 57 07 d1 a0 e0 00 Device Fault; Error: ABRT 128 sectors at LBA = 0x5707d1a0 = 1460130208 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 00 80 00 00 57 07 d1 a0 e0 00 07:03:07.389 READ DMA EXT 35 00 00 00 08 00 00 00 5c 18 58 e0 00 07:03:07.388 WRITE DMA EXT 25 00 00 00 80 00 00 57 07 d1 98 e0 00 07:03:07.388 READ DMA EXT 35 00 00 00 10 00 00 00 57 08 08 e0 00 07:03:07.387 WRITE DMA EXT 35 00 00 00 01 00 00 00 7e 96 d0 e0 00 07:03:06.966 WRITE DMA EXT Error 14148 [11] occurred at disk power-on lifetime: 2143 hours (89 days + 7 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 04 -- 61 00 08 00 00 00 5c 18 58 e0 00 Device Fault; Error: ABRT 8 sectors at LBA = 0x005c1858 = 6035544 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 35 00 00 00 08 00 00 00 5c 18 58 e0 00 07:03:07.388 WRITE DMA EXT 25 00 00 00 80 00 00 57 07 d1 98 e0 00 07:03:07.388 READ DMA EXT 35 00 00 00 10 00 00 00 57 08 08 e0 00 07:03:07.387 WRITE DMA EXT 35 00 00 00 01 00 00 00 7e 96 d0 e0 00 07:03:06.966 WRITE DMA EXT 25 00 00 00 20 00 00 00 31 11 d4 e0 00 07:03:06.962 READ DMA EXT Error 14147 [10] occurred at disk power-on lifetime: 2143 hours (89 days + 7 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 04 -- 61 00 80 00 00 57 07 d1 98 e0 00 Device Fault; Error: ABRT 128 sectors at LBA = 0x5707d198 = 1460130200 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 00 80 00 00 57 07 d1 98 e0 00 07:03:07.388 READ DMA EXT 35 00 00 00 10 00 00 00 57 08 08 e0 00 07:03:07.387 WRITE DMA EXT 35 00 00 00 01 00 00 00 7e 96 d0 e0 00 07:03:06.966 WRITE DMA EXT 25 00 00 00 20 00 00 00 31 11 d4 e0 00 07:03:06.962 READ DMA EXT 25 00 00 00 1a 00 00 00 1a a2 ee e0 00 07:03:06.464 READ DMA EXT Error 14146 [9] occurred at disk power-on lifetime: 2143 hours (89 days + 7 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 04 -- 61 00 10 00 00 00 57 08 08 e0 00 Device Fault; Error: ABRT 16 sectors at LBA = 0x00570808 = 5703688 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 35 00 00 00 10 00 00 00 57 08 08 e0 00 07:03:07.387 WRITE DMA EXT 35 00 00 00 01 00 00 00 7e 96 d0 e0 00 07:03:06.966 WRITE DMA EXT 25 00 00 00 20 00 00 00 31 11 d4 e0 00 07:03:06.962 READ DMA EXT 25 00 00 00 1a 00 00 00 1a a2 ee e0 00 07:03:06.464 READ DMA EXT 25 00 00 00 80 00 00 57 07 d1 98 e0 00 07:03:06.389 READ DMA EXT Error 14145 [8] occurred at disk power-on lifetime: 2143 hours (89 days + 7 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 04 -- 61 00 01 00 00 00 7e 96 d0 e0 00 Device Fault; Error: ABRT 1 sectors at LBA = 0x007e96d0 = 8296144 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 35 00 00 00 01 00 00 00 7e 96 d0 e0 00 07:03:06.966 WRITE DMA EXT 25 00 00 00 20 00 00 00 31 11 d4 e0 00 07:03:06.962 READ DMA EXT 25 00 00 00 1a 00 00 00 1a a2 ee e0 00 07:03:06.464 READ DMA EXT 25 00 00 00 80 00 00 57 07 d1 98 e0 00 07:03:06.389 READ DMA EXT 35 00 00 00 08 00 00 00 5c 18 58 e0 00 07:03:06.389 WRITE DMA EXT Error 14144 [7] occurred at disk power-on lifetime: 2143 hours (89 days + 7 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 04 -- 61 00 20 00 00 00 31 11 d4 e0 00 Device Fault; Error: ABRT 32 sectors at LBA = 0x003111d4 = 3215828 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 00 20 00 00 00 31 11 d4 e0 00 07:03:06.962 READ DMA EXT 25 00 00 00 1a 00 00 00 1a a2 ee e0 00 07:03:06.464 READ DMA EXT 25 00 00 00 80 00 00 57 07 d1 98 e0 00 07:03:06.389 READ DMA EXT 35 00 00 00 08 00 00 00 5c 18 58 e0 00 07:03:06.389 WRITE DMA EXT 35 00 00 00 10 00 00 00 57 08 08 e0 00 07:03:06.388 WRITE DMA EXT Error 14143 [6] occurred at disk power-on lifetime: 2143 hours (89 days + 7 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 04 -- 61 00 1a 00 00 00 1a a2 ee e0 00 Device Fault; Error: ABRT 26 sectors at LBA = 0x001aa2ee = 1745646 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 00 1a 00 00 00 1a a2 ee e0 00 07:03:06.464 READ DMA EXT 25 00 00 00 80 00 00 57 07 d1 98 e0 00 07:03:06.389 READ DMA EXT 35 00 00 00 08 00 00 00 5c 18 58 e0 00 07:03:06.389 WRITE DMA EXT 35 00 00 00 10 00 00 00 57 08 08 e0 00 07:03:06.388 WRITE DMA EXT 35 00 00 00 01 00 00 00 7e 96 d0 e0 00 07:03:05.967 WRITE DMA EXT SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 258 (0x0102) SCT Support Level: 1 Device State: Active (0) Current Temperature: 26 Celsius Power Cycle Min/Max Temperature: 21/26 Celsius Lifetime Min/Max Temperature: 21/55 Celsius Under/Over Temperature Limit Count: 0/0 Vendor specific: 01 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/60 Celsius Min/Max Temperature Limit: -41/85 Celsius Temperature History Size (Index): 478 (315) Index Estimated Time Temperature Celsius 316 2017-05-25 00:09 33 ************** ... ..( 52 skipped). .. ************** 369 2017-05-25 01:02 33 ************** 370 2017-05-25 01:03 32 ************* ... ..(151 skipped). .. ************* 44 2017-05-25 03:35 32 ************* 45 2017-05-25 03:36 ? - 46 2017-05-25 03:37 22 *** 47 2017-05-25 03:38 21 ** 48 2017-05-25 03:39 22 *** 49 2017-05-25 03:40 23 **** ... ..( 2 skipped). .. **** 52 2017-05-25 03:43 23 **** 53 2017-05-25 03:44 24 ***** 54 2017-05-25 03:45 24 ***** 55 2017-05-25 03:46 24 ***** 56 2017-05-25 03:47 25 ****** 57 2017-05-25 03:48 25 ****** 58 2017-05-25 03:49 26 ******* 59 2017-05-25 03:50 26 ******* 60 2017-05-25 03:51 34 *************** 61 2017-05-25 03:52 33 ************** ... ..( 12 skipped). .. ************** 74 2017-05-25 04:05 33 ************** 75 2017-05-25 04:06 32 ************* ... ..( 16 skipped). .. ************* 92 2017-05-25 04:23 32 ************* 93 2017-05-25 04:24 31 ************ ... ..( 24 skipped). .. ************ 118 2017-05-25 04:49 31 ************ 119 2017-05-25 04:50 32 ************* ... ..( 2 skipped). .. ************* 122 2017-05-25 04:53 32 ************* 123 2017-05-25 04:54 33 ************** ... ..( 22 skipped). .. ************** 146 2017-05-25 05:17 33 ************** 147 2017-05-25 05:18 34 *************** ... ..( 54 skipped). .. *************** 202 2017-05-25 06:13 34 *************** 203 2017-05-25 06:14 33 ************** 204 2017-05-25 06:15 34 *************** ... ..( 9 skipped). .. *************** 214 2017-05-25 06:25 34 *************** 215 2017-05-25 06:26 33 ************** 216 2017-05-25 06:27 34 *************** 217 2017-05-25 06:28 33 ************** ... ..( 24 skipped). .. ************** 242 2017-05-25 06:53 33 ************** 243 2017-05-25 06:54 34 *************** 244 2017-05-25 06:55 34 *************** 245 2017-05-25 06:56 33 ************** 246 2017-05-25 06:57 34 *************** ... ..( 31 skipped). .. *************** 278 2017-05-25 07:29 34 *************** 279 2017-05-25 07:30 33 ************** ... ..( 35 skipped). .. ************** 315 2017-05-25 08:06 33 ************** SCT Error Recovery Control command not supported Device Statistics (GP/SMART Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 4 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 4 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x8000 4 894 Vendor specific /dev/sdb === START OF INFORMATION SECTION === Model Family: SandForce Driven SSDs Device Model: SanDisk SDSSDA240G Serial Number: -- LU WWN Device Id: 5 001b44 ... Firmware Version: Z22000RL User Capacity: 240.057.409.536 bytes [240 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 1.8 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Thu May 25 08:06:35 2017 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Disabled Rd look-ahead is: Disabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x71) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. Conveyance self-test routine recommended polling time: ( 2) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Retired_Block_Count -O--CK 100 100 000 - 0 9 Power_On_Hours_and_Msec -O--CK 078 100 000 - 590h+00m+00.000s 12 Power_Cycle_Count -O--CK 100 100 000 - 1235 166 Unknown_Attribute -O--CK 100 100 000 - 77 167 Unknown_Attribute -O--CK 100 100 000 - 0 168 Unknown_Attribute -O--CK 100 100 000 - 112 169 Unknown_Attribute -O--CK 100 100 000 - 29 170 Reserve_Block_Count -O--CK 100 100 000 - 0 171 Program_Fail_Count -O--CK 100 100 000 - 0 172 Erase_Fail_Count -O--CK 100 100 000 - 0 173 Unknown_SandForce_Attr -O--CK 100 100 --- - 101 174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 550 187 Reported_Uncorrect -O--CK 100 100 000 - 0 194 Temperature_Celsius -O---K 068 100 000 - 32 (Min/Max 0/56) 199 SATA_CRC_Error_Count -O--CK 100 100 000 - 18 230 Life_Curve_Status -O--CK 100 100 000 - 3 232 Available_Reservd_Space PO--CK 100 100 004 - 100 233 SandForce_Internal -O--CK 100 100 000 - 23428 241 Lifetime_Writes_GiB ----CK 253 253 000 - 6186 242 Lifetime_Reads_GiB ----CK 253 253 000 - 5723 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x02 GPL,SL R/O 1 Comprehensive SMART error log 0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 GPL,SL R/O 1 SMART self-test log 0x07 GPL,SL R/O 1 Extended self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 SATA NCQ Queued Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) Device Error Count: 1167 (device log contains only the most recent 4 errors) CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1167 [2] log entry is empty Error 1166 [1] log entry is empty Error 1165 [0] log entry is empty Error 1164 [3] log entry is empty SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 2) == 0x01 0x008 4 1235 --- Lifetime Power-On Resets 0x01 0x010 4 590 --- Power-on Hours 0x01 0x018 6 6186 --- Logical Sectors Written 0x01 0x020 6 167891442 --- Number of Write Commands 0x01 0x028 6 5723 --- Logical Sectors Read 0x01 0x030 6 167749241 --- Number of Read Commands 0x02 ===== = = === == Free-Fall Statistics (empty) == 0x03 ===== = = === == Rotating Media Statistics (empty) == 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 673 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 32 --- Current Temperature 0x05 0x010 1 -43 --- Average Short Term Temperature 0x05 0x018 1 -51 --- Average Long Term Temperature 0x05 0x020 1 56 --- Highest Temperature 0x05 0x028 1 10 --- Lowest Temperature 0x05 0x030 1 -1 --- Highest Average Short Term Temperature 0x05 0x038 1 1 --- Lowest Average Short Term Temperature 0x05 0x040 1 -1 --- Highest Average Long Term Temperature 0x05 0x048 1 0 --- Lowest Average Long Term Temperature 0x05 0x050 4 0 --- Time in Over-Temperature 0x05 0x058 1 100 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 191174 --- Number of Hardware Resets 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 3 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 5 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC