Probe #0e7c096e7f of ASUSTek B85M-E Desktop Computer (All Series)

Log: smartctl

/dev/sda smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.5.6-100.fc30.x86_64] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Western Digital RE4-GP Device Model: WDC WD2002FYPS-02W3B0 Serial Number: -- LU WWN Device Id: 5 0014ee ... Firmware Version: 04.01G01 User Capacity: 2,000,398,934,016 bytes [2.00 TB] Sector Size: 512 bytes logical/physical Rotation Rate: 5400 rpm Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS (minor revision not indicated) SATA Version is: SATA 2.6, 3.0 Gb/s Local Time is: Mon Mar 2 09:38:47 2020 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 128 (minimum power consumption without standby) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (41760) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 423) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x303f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 200 200 051 - 3 3 Spin_Up_Time POS--K 230 228 021 - 10491 4 Start_Stop_Count -O--CK 097 097 000 - 3530 5 Reallocated_Sector_Ct PO--CK 200 200 140 - 0 7 Seek_Error_Rate -OSR-K 100 253 000 - 0 9 Power_On_Hours -O--CK 048 048 000 - 38201 10 Spin_Retry_Count -O--CK 100 100 000 - 0 11 Calibration_Retry_Count -O--CK 100 100 000 - 0 12 Power_Cycle_Count -O--CK 097 097 000 - 3521 192 Power-Off_Retract_Count -O--CK 200 200 000 - 51 193 Load_Cycle_Count -O--CK 110 110 000 - 271901 194 Temperature_Celsius -O---K 127 102 000 - 25 196 Reallocated_Event_Count -O--CK 200 200 000 - 0 197 Current_Pending_Sector -O--CK 200 200 000 - 0 198 Offline_Uncorrectable ----CK 200 200 000 - 0 199 UDMA_CRC_Error_Count -O--CK 200 200 000 - 2 200 Multi_Zone_Error_Rate ---R-- 200 200 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 5 Comprehensive SMART error log 0x03 GPL R/O 6 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa0-0xa7 GPL,SL VS 16 Device vendor specific log 0xa8-0xb5 GPL,SL VS 1 Device vendor specific log 0xb6 GPL VS 1 Device vendor specific log 0xb7 GPL,SL VS 1 Device vendor specific log 0xbd GPL,SL VS 1 Device vendor specific log 0xc0 GPL,SL VS 1 Device vendor specific log 0xc1 GPL VS 24 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (6 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 32952 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 258 (0x0102) Device State: Active (0) Current Temperature: 25 Celsius Power Cycle Min/Max Temperature: 23/25 Celsius Lifetime Min/Max Temperature: 22/50 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/60 Celsius Min/Max Temperature Limit: -41/85 Celsius Temperature History Size (Index): 478 (205) Index Estimated Time Temperature Celsius 206 2020-03-02 01:41 34 *************** ... ..( 4 skipped). .. *************** 211 2020-03-02 01:46 34 *************** 212 2020-03-02 01:47 33 ************** ... ..(276 skipped). .. ************** 11 2020-03-02 06:24 33 ************** 12 2020-03-02 06:25 34 *************** ... ..( 13 skipped). .. *************** 26 2020-03-02 06:39 34 *************** 27 2020-03-02 06:40 35 **************** ... ..( 7 skipped). .. **************** 35 2020-03-02 06:48 35 **************** 36 2020-03-02 06:49 ? - 37 2020-03-02 06:50 23 **** 38 2020-03-02 06:51 23 **** 39 2020-03-02 06:52 23 **** 40 2020-03-02 06:53 24 ***** 41 2020-03-02 06:54 25 ****** 42 2020-03-02 06:55 25 ****** 43 2020-03-02 06:56 25 ****** 44 2020-03-02 06:57 36 ***************** ... ..( 17 skipped). .. ***************** 62 2020-03-02 07:15 36 ***************** 63 2020-03-02 07:16 ? - 64 2020-03-02 07:17 34 *************** ... ..( 4 skipped). .. *************** 69 2020-03-02 07:22 34 *************** 70 2020-03-02 07:23 35 **************** ... ..(119 skipped). .. **************** 190 2020-03-02 09:23 35 **************** 191 2020-03-02 09:24 34 *************** ... ..( 13 skipped). .. *************** 205 2020-03-02 09:38 34 *************** SCT Error Recovery Control: Read: 70 (7.0 seconds) Write: 70 (7.0 seconds) Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x000a 2 2 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x8000 4 397 Vendor specific /dev/sdb smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.5.6-100.fc30.x86_64] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 840 PRO Series Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: DXM05B0Q User Capacity: 128,035,676,160 bytes [128 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Mon Mar 2 09:38:47 2020 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 15) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 098 098 000 - 9039 12 Power_Cycle_Count -O--CK 096 096 000 - 3296 177 Wear_Leveling_Count PO--C- 097 097 000 - 88 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 076 042 000 - 24 195 ECC_Error_Rate -O-RC- 200 200 000 - 0 199 CRC_Error_Count -OSRCK 099 099 000 - 1 235 POR_Recovery_Count -O--C- 099 099 000 - 86 241 Total_LBAs_Written -O--CK 099 099 000 - 5364287646 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x02 GPL,SL R/O 1 Comprehensive SMART error log 0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log 0x06 GPL,SL R/O 1 SMART self-test log 0x07 GPL,SL R/O 1 Extended self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 NCQ Command Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 1 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa0 GPL,SL VS 16 Device vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 4245 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 255 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) Device State: SCT command executing in background (5) Current Temperature: 40 Celsius Power Cycle Min/Max Temperature: 40/40 Celsius Lifetime Min/Max Temperature: 0/70 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 3 (Unknown, should be 2) Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (0) Index Estimated Time Temperature Celsius 1 2020-03-02 07:31 ? - ... ..(125 skipped). .. - 127 2020-03-02 09:37 ? - 0 2020-03-02 09:38 40 ********************* SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 2 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC


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